We present the single event effect ( SEE ) tolerance of a mixed-signal application-specific integrated circuit ( ASIC ) developed for a charge-coupled device camera onboard a future X-ray astronomical mission .
We adopted proton and heavy ion beams at HIMAC/NIRS in Japan .
The particles with high linear energy transfer ( LET ) of 57.9Â MeV \cdot cm ^ { 2 } /mg is used to measure the single event latch-up ( SEL ) tolerance , which results in a sufficiently low cross-section of \sigma _ { SEL } < 4.2 \times 10 ^ { -11 } Â cm ^ { 2 } / ( Ion \times ASIC ) .
The single event upset ( SEU ) tolerance is estimated with various kinds of species with wide range of energy .
Taking into account that a part of the protons creates recoiled heavy ions that has higher LET than that of the incident protons , we derived the probability of SEU event as a function of LET .
Then the SEE event rate in a low-earth orbit is estimated considering a simulation result of LET spectrum .
SEL rate is below once per 49 years , which satisfies the required latch-up tolerance .
The upper limit of the SEU rate is derived to be 1.3 \times 10 ^ { -3 } Â events/sec .
Although the SEU events can not be distinguished from the signals of X-ray photons from astronomical objects , the derived SEU rate is below 1.3Â % of expected non X-ray background rate of the detector and hence these events should not be a major component of the instrumental background .